2018.09-Present Ph.D., University of Chinese Academy of Sciences
2014.09-2018.06 B.S., Huazhong University of Science and Technology
The application of scanning transmission electron microscopy (STEM) on materials science has been a tremendous success over the past decades. However, more and more problems occur as the insights of the relationship of materials’ structures, properties and performances going deeper. The demand to meet new challenges motivate the development of STEM. As one of frontiers of STEM, 4D-STEM is promising for characterizing beam sensitive materials, revealing the electromagnetic fields at atomic scale, measuring strain over a large field of view and providing an unprecedented rich information of materials. Our goal is to promote the development and application of 4D-STEM for materials science. Specifically, following and pushing limits of technological frontiers of sub-areas in 4D-STEM, including Ptychography, Differential Phase Contrast imaging (DPC), Nano Beam Electron diffraction (NBED) and Virtual Imaging, we are in great chance to uncover ‘never seen before’ properties of materials and laws hidden deep in Condensed Matter Physics.
List of UCAS Publications:
 Shoucong Ning, Wenhui Xu, Yinhang Ma, et al. Accurate and Robust Calibration of the Uniform Affine Transformation Between Scan-Camera Coordinates for Atom-Resolved In-Focus 4D-STEM Datasets[J]. Microscopy and Microanalysis, 2022, 1-11
 Yong Zhu, Lei Tao, Xiya Chen, Yinhang Ma, et al. Anisotropic point defects in rhenium diselenide monolayers. iScience, 2021, 24(12), 103456.